Triboindenter – Hysitron TI 980

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The TI 980 Triboindenter is most advanced nanomechanical test instrument that operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. TI 980 delivers a new level of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization.

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Measurement

  • Modulus of elasticity
  • Nano-Hardness
  • Coefficient of friction by nano-scratch testing
  • Wear resistance by scanning wear test

 

TI 980 Platform Specification

  • Maximum force : 30 mN 
  • Normal force bit resolution : 3 nN
  • Minimum contact force : < 70 nN
  • Maximum load rate : > 50 mN/s
  • Force noise floor : 20 nN
  • Displacement noise floor : 0.1 nm 3D Omniprobe
  • Maximum Lateral Force: 5 N  
  • Maximum Scratch Length: 150 mm
  • Maximum Normal Force: Selectable, 1 N to 10 N
  • Maximum Normal Displ. 80 μm
  • High load DMA option
  • Frequency Range: 0.1-100 Hz  

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    Triboindenter – Hysitron TI 980
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      Advanced Performech® II Control Module and Electronics

      • nanoDMA® III
      • In-situ SPM Imaging

        (a) Minimum imaging force

        <70nN

        (b) Scan rate

        0.01Hz-3.0Hz

        (c) Scan resolution

        4096 pixels x 4096 lines per image

        (d) Maximum scan volume

        75x75x4mm

        (e) Tip positioning accuracy against In-situ SPM Imaging

        +/- 10nm

      • Scanning Wear

        (a) Wear track size

        Adjustable from <1mm to 75mm

        (b) Lateral velocity

        ≤ 225mm/s

        (c) Normal load range

        70nN- 1mN

      • X, Y, Z translation stage

        (a) X-Y-Z Travel

        250mmx150mmx50mm or more

        (b) Measured accuracy

        <1mm

        (c) Measured positioning repeatability

        <1mm

        (d) Micro step resolution X, Y axis

        50nm

        (e) Micro step resolution Z axis

        3nm

        (f) X-Y encoder resolution

        100nm

        (g) Maximum translation speed X, Y axis

        30mm/s

        (h) Maximum translation speed Z axis

        1.9mm/s

      • High Speed Data Acquisition

        (a) Data acquisition rate (open and closed loop) and Feedback loop rate in closed loop operation

        Up to 38,000 points/second and 78kHz or greater utilizing any user-defined load function

        (b) Load time

        0.1 – 2000 seconds.

        (c) Maximum number of loading segments

        2,000

      • Dynamic Nanoindentation Testing Technique : Amplitude, phase, contact stiffness and damping coefficient

        (a)  Frequency Range

        0.1Hz-300Hz

        (b) Maximum Dynamic Force Amplitude and Quasi-Static Force

        5mN and 10mN respectively

        (c) Maximum Dynamic Displacement Amplitude

        2.5μm

        (d) Maximum Quasi-Static Displacement

        5μm

        (e) Displacement Noise Floor

        <0.2nm

      Related Links

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      nano2-2